[ect-announce-ja] 【ご案内】 CFP IEEE VLSI Test Symp. 2020 (アブストラクト締切10月4日)

[Yasuhiro TAKAHASHI]

研究者，技術者各位

群馬大学の小林先生より，
38th IEEE VLSI Test Symposium (VTS'20)
の論文募集案内がございました。皆様，奮ってご投稿下さい。

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VLSI テストシンポジウム　論文募集
（2020年4月5-8日　米国カルフォルニア州サンディエゴ市にて開催）

2019年10月4日(金) 論文タイトル、アブストラクト、著者の登録締め切り
　　　 10月11日（金）論文原稿の締め切り

http://tttc-vts.org/public_html/new/2020/call-for-papers/

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Call for Papers
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38th IEEE VLSI Test Symposium (VTS'20)
April 5-8, 2020, San Diego, CA (USA)
http://www.tttc-vts.org/

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Scope:
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The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel
concepts in testing, reliability and security of microelectronic circuits
and systems.
The VTS Program Committee invites original, unpublished paper submissions
for VTS 2020. Proposals for the innovative practices and special sessions
tracks are also invited.

Major topics include but are not limited to:

* Analog/Mixed-Signal/RF Test
* ATPG & Compression
* Silicon Debug
* Automotive Test & Safety
* Built-In Self-Test (BIST)
* Defect & Current Based Test
* Defect/Fault Tolerance
* Delay & Performance Test
* Design for Testability (DFT)
* Design Verification/Validation
* Embedded System & Board Test
* Embedded Test Methods
* Emerging Technologies
* Test FPGA
* Test Fault Modeling and Simulation
* Hardware Security
* Low-Power IC Test
* Microsystems/MEMS/Sensors Test
* Memory Test and Repair
* On-Line Test & Error Correction
* Power/Thermal Issues in Test
* System-on-Chip (SOC) Test
* Test Standards & Economics
* Test of Biomedical Devices
* Test of High-Speed I/O
* Test Quality and Reliability
* Test Resource Partitioning
* Transients and Soft Errors
* 2.5D, 3D and SiP Test
* Yield Optimization

New hot topics:
VTS puts particular emphasis on enlarging its scope soliciting submissions
on aspects on the following hot topics: Testing AI and Neuromorphic Devices,
Machine Learning for Test, Test/Reliability/Security in Approximate and
Quantum Computing.

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Key Dates:
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* Regular paper registration (title, abstract and authors): October 4th,
2019
* Regular paper PDF upload:  October 11th, 2019
* Special sessions and IP tracks submission: October 11th, 2019
* Notification of acceptance: December 10th, 2019
* Camera ready deadline: February 7, 2020

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Submissions:
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The VTS Program Committee invites original, unpublished Paper Submissions
for VTS 2020. Paper submissions should be complete manuscripts, up to six
pages (inclusive of figures, tables, and bibliography) in a standard IEEE
two-column format; papers exceeding the page limit will be returned without
review. Authors should clearly explain the significance of the work,
highlight novel features, and describe its current status. On the title
page, please include: author name(s) and affiliation(s), and the mailing
address, phone number, and e-mail address of the contact author. A 50-word
abstract and five keywords identifying the topic area are also required.

Proposals for the Innovative Practices and Special Sessions tracks are also
invited. The innovative practices track highlights cutting-edge challenges
faced by test practitioners, and innovative solutions employed to address
them. Special sessions can include invited presentations on hot topics,
panels, embedded tutorials. Innovative practices and special session track
proposals should include a title, name and contact information of the
session organizer(s), a 150-to-200 word abstract, and a list of prospective
participants.

All submissions are to be made electronically through the VTS website. A
submission will be considered as evidence that, upon acceptance, the
author(s) will submit a final camera-ready version of the paper.
Registration of at least one author by the camera-ready deadline and
presentation of the paper at the symposium are also required for inclusion
of the paper in the published proceedings.

VTS 2020 will present a Best Paper Award, a Best Special Session Award, and
a Best Innovative Practices Session Award based on the evaluations of
reviewers, attendees, and an invited panel of judges. We also plan to
organize various Student Activities including the TTTC Best Doctoral Thesis
Contest and PhD Poster Forum, details for which will be made available
through the VTS website.

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Information:
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For general information:
General Chairs
Lorena Anghel (TIMA) - e-mail: lorena.anghel ＠ imag.fr
Amit Majumdar (Xilinx) - e-mail: amajumd ＠ xilinx.com

For submission-related information:
Program Co-chairs
Stefano Di Carlo (Politecnico di Torino) - e-mail: stefano.dicarlo ＠ polito.it
Peilin Song (IBM Research) - e-mail: psong ＠ us.ibm.com

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The 38th IEEE VLSI Test Symposium is sponsored by the Institute of
Electrical and Electronics Engineers (IEEE) Computer Society's Test
Technology Technical Council (TTTC).